HB
Hans-Albert Büsse
Director International Sales Contact Probes at Feinmetall
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Work Experience
Director International Sales Contact Probes
Apr 1993 - Present · 31 years and 9 months
Company Details
501-1000 Employees
Since 1964 FEINMETALL GmbH is a leading company for spring contact probes and wafer probe cards. Our passion is to develop and manufacture contacting solutions for testing electrical and electronic components. Our products are being used in the semiconductor, electrical and electronic and automotive industry, and in many other segments. It does not matter where in this world test jobs need to be mastered, there is a good chance that FEINMETALL is just around the corner. We always have a finger on the pulse of the market and are available to our customers on site with many locations in America, Asia and Europe. Spring contact probes are used to test printed circuit boards, wire harnesses, connectors and other electronic components. We offer a wide range of contact probe varieties for each specific contact-making task, always tailored to the customers' needs. Wafer probe cards are used for contacting semiconductor wafers. Our solutions include vertical probe cards, probe cards for pads and copper pillars, probe cards for WLCSP, SiP analog and mixed signal flip chip applications as well as Cantilever probe cards. Even for the most difficult contact-making tasks, highly specialized development and engineering teams find the best possible solutions for our customers.
Year Founded
1964
Social Media
LinkedinFacebook
Industry
Appliances, Electrical, and Electronics Manufacturing, Cars - electrical and electronic parts and components, Material & Equipment, Vehicles & Transport Equipment, Electrical components and parts, Test and calibration equipment for printed circuit boards (PCBs), Measuring and testing equipment, Electrical, Electronics & Optical, Testing equipment for the electronics industry, Probes, spring contact, for testing electronic assembly components
HQ Location
Zeppelinstraße 8 Herrenberg, Germany 71083, DE
Keywords
Spring Contact Probes: ICT/FCT ProbesWire Harness ProbesWire Harness TestRadio Frequency ProbesCoaxial ProbesHigh Current ProbesBattery Test ProbesSwitch ProbesFine Pitch Probes and Wafer Probe Cards: CantileverVertical
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