Four Dimensions,

Four Dimensions manufactures advanced semiconductor probing systems since 1978. Our Four Point Probe and CVmap systems are found in hundreds of fabs and research institutions around the world. Products: We provide four point probes with an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring PN junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing. Four-Point Probe: - extended measurement range - high compliance voltage (enables measuring high resistivity thicker sample) - partial wafer mapping - very user-friendly software We offer the widest range of Mercury probe geometries and special capacitance measurement electronics. This permits our systems to probe and characterize a wide range of materials, including semi-conductors, oxides, dielectrics, SOI ( silicon on insulator ), and films on conducting or insulating substrates. CVmap: - safe design (contact from below) - special designed spill proof mercury reservoir - excellent contact area repeatability - more than one con contact area on the front side - refreshing mercury 9refreshes mercury before each contact) - easy to replace parts and mercury - compact design (small footprint) - only need to change mercury twice a year - offer the widest range of contact areas and probe head configurations - no frequent calibration needed - very user-friendly software